November 5, 2006 | Washington DC, USA
Mr. V.K. Bafna, Managing Director of TCR Engineering Services will be speaking at the conference of
Root Cause Analysis 2006 - "Successful Applications for Plant Reliability," being held from December 11-13, 2006, at the Hilton Houston Post Oak in Houston, Texas, USA.
This workshop and conference will provide plant reliability, maintenance, design, and operations professionals with the opportunity to learn more about the RCA process and to share stories about its applications, both successful and unsuccessful.
Any plant reliability initiative is designed to eliminate recurring problems or reduce risk requires decisions and resources. Root cause analysis enables plant managers and engineers to allocate their time and money effectively by eliminating or significantly reducing the guesswork associated with key decisions. Simply stated, you can't correct a problem until you know what it is.
Research and experience has proved that instinctive knee-jerk responses to failures are commonly wrong. Attending Mr. Bafna's speech at the Root Cause Analysis 2006 will give conference participants the tools they need to successfully identify and correct problems before failures repeat themselves.
Other speakers at the conference include Jim Fitch (Noria Corporation), Bob Gleichman (Celanese Chemical), Mark Galley (ThinkReliablity), Jeremy Donovan (ConocoPhillips), Robert Nelms (Failsafe Network), Garrett Olszewski (Raytheon Missile Systems) and other prominent scientists and failure and root cause analysis investigators.
Download a brochure of the
RCA 2006 conference.
