Residual Stress Measurement by XRD
TCR launches Residual Stress Measurement by XRD as per ASTM E2860-20—precision-driven, non-destructive, and standards-compliant.
Services · Materials Testing
Residual Stress Determination by X-Ray Diffraction
Measurement runs to ASTM E2860. Welds, machined surfaces and shot-peened parts are read without cutting them, so a specified compressive layer can be verified rather than assumed, and a suspected residual-stress driver confirmed during investigation.
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Overview
Residual-stress measurement by X-ray diffraction quantifies surface and near-surface residual stress in welds, machined components, and shot-peened or surface-treated parts. The sin-squared-psi technique resolves the tensile and compressive stress fields that drive fatigue initiation and stress-corrosion susceptibility, which makes it a primary tool for weld qualification, peening verification, and failure investigation where residual stress is the suspected driver.
What the measurement is
Residual-stress measurement by X-ray diffraction quantifies surface and near-surface residual stress in welds, machined components, and shot-peened or surface-treated parts. The reading is taken without cutting the part, so a specified compressive layer can be verified rather than assumed.
The sin-squared-psi technique resolves the tensile and compressive stress fields locked into a component after welding, machining, grinding, or peening. Tensile residual stress at a surface adds to the service load and drives fatigue initiation and stress-corrosion susceptibility; a controlled compressive layer, for example from shot peening, does the opposite. The measurement separates the two and puts a number on them.
Where it applies
The method is a primary tool for weld qualification, peening verification, and failure investigation where residual stress is the suspected driver.
On a weld, it confirms whether the residual-stress state left by the procedure is acceptable. On a shot-peened or surface-treated part, it verifies that the intended compressive layer is present and of the expected magnitude. In a failure investigation, it confirms or rules out residual stress as a contributor to fatigue or stress-corrosion cracking.
Governing standard
Measurement runs to ASTM E2860, the standard method for residual-stress measurement by X-ray diffraction.
| Method | Application | Standard |
|---|---|---|
| Residual-stress measurement by X-ray diffraction (sin-squared-psi) | Surface and near-surface residual stress in welds, machined surfaces, and shot-peened or surface-treated parts | ASTM E2860 |
The instrument
Measurement is made on an X-ray diffraction spectrometer.
X-ray diffraction analysis investigates the crystalline structure of a material, including atomic arrangement, crystallite size, and imperfections. The X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate the beam, and directed toward the sample. Residual-stress determination reads the response with specimen tilt to resolve the stress in the surface layer, and the same determination sits inside the NADCAP AC7101 verification scope for aerospace process-verification work. TCR Engineering is a NABL ISO/IEC 17025:2017 accredited laboratory, certificate NABLT0726MH18640.
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Frequently asked questions
Which standard governs residual-stress measurement by X-ray diffraction at TCR?
Measurement runs to ASTM E2860, the standard method for residual-stress measurement by X-ray diffraction. The reading is non-destructive and uses the sin-squared-psi technique. TCR Engineering is a NABL ISO/IEC 17025:2017 accredited laboratory, certificate NABLT0726MH18640.
What components can be measured?
Welds, machined surfaces, and shot-peened or surface-treated parts are read without cutting them, so a specified compressive layer can be verified rather than assumed.
Why is residual stress measured?
Tensile and compressive residual-stress fields drive fatigue initiation and stress-corrosion susceptibility. The measurement supports weld qualification, peening verification, and failure investigation where residual stress is the suspected driver.
Is the method destructive?
No. X-ray diffraction reads the surface and near-surface layer non-destructively, so the part is not sectioned. This makes it suitable for verifying that a specified compressive layer is present.